"Improvement of oxide reliability in NAND flash memories using tight ..."

Riichiro Shirota et al. (2015)

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DOI: 10.1109/IRPS.2015.7112814

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-05

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Riichiro Shirota, Bo-Jun Yang, Yung-Yueh Chiu, Yu-Ting Wu, Pin-Yao Wang, Jung-Ho Chang, Masaru Yano, Minoru Aoki, Toshiaki Takeshita, C.-Y. Wang, Ikuo Kurachi:
Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period. IRPS 2015: 12

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