"Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM ..."

Hyewon Seo et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117671

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type: Conference or Workshop Paper

metadata version: 2023-05-24

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Hyewon Seo, Taiuk Rim, Eunsun Lee, Sekyoung Jang, Kyosuk Chae, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee:
Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices. IRPS 2023: 1-6

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