"SiC MOSFET threshold voltage stability during power cycling testing and ..."

Christian Schwabe et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118274

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler:
SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. IRPS 2023: 1-6

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