"Comprehensive study on prediction of endurance properties from breakdown ..."

Hideo Sato et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118152

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-20

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  - conf/irps/SatoSJLBKRLHJLKLLPSJSKK23
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Hideo Sato, H. M. Shin, H. Jung, S. W. Lee, H. Bae, H. Kwon, K. H. Ryu, W. C. Lim, Y. S. Han, J. H. Jeong, J. M. Lee, D. S. Kim, K. Lee, J. H. Lee, J. H. Park, Y. J. Song, Y. Ji, B. I. Seo, J. W. Kim, H. H. Kim:
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. IRPS 2023: 1-5

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