"A new test procedure to realistically estimate end-of-life electrical ..."

Paul Salmen et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405207

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Paul Salmen, Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Gerald Rescher, Thomas Aichinger:
A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation. IRPS 2021: 1-7

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