"Physical Insights into the DC and Transient Reverse Bias Reliability of ..."

Harsh Raj et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118069

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava:
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes. IRPS 2023: 1-4

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