"Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors."

Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava (2023)

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DOI: 10.1109/IRPS48203.2023.10118278

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava:
Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors. IRPS 2023: 1-4

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