"Single-Event Latchup Vulnerability at the 7-nm FinFET Node."

Nicholas J. Pieper et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764419

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva:
Single-Event Latchup Vulnerability at the 7-nm FinFET Node. IRPS 2022: 5

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