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"Effects of front-end-of line process variations and defects on retention ..."

Jongwoo Park et al. (2015)

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DOI: 10.1109/IRPS.2015.7112674

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-04

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  dblp key:
  - conf/irps/ParkLKKCILCPSP15
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  - https://dblp.org/rec/conf/irps/ParkLKKCILCPSP15
Jongwoo Park, Miji Lee, Hanbyul Kang, Wooram Ko, Eunkyeong Choi, Junsik Im, Minwoo Lee, Dohwan Chung, Jinchul Park, Sangchul Shin, Sangwoo Pae:
Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism. IRPS 2015: 2

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