"Current Crowding Impact on Electromigration in Al Interconnects."

Young-Joon Park et al. (2019)

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DOI: 10.1109/IRPS.2019.8720448

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan:
Current Crowding Impact on Electromigration in Al Interconnects. IRPS 2019: 1-6

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