"Prediction of NBTI stress and recovery time kinetics in Si capped SiGe ..."

Narendra Parihar, Souvik Mahapatra (2018)

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DOI: 10.1109/IRPS.2018.8353700

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Narendra Parihar, Souvik Mahapatra:
Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs. IRPS 2018: 5-1

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