"Ambient temperature and layout impact on self-heating characterization in ..."

Peter C. Paliwoda et al. (2018)

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DOI: 10.1109/IRPS.2018.8353640

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-29

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Peter C. Paliwoda, Zakariae Chbili, A. Kerber, D. Singh, Durga Misra:
Ambient temperature and layout impact on self-heating characterization in FinFET devices. IRPS 2018: 6

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