"SOI FinFET soft error upset susceptibility and analysis."

Phil Oldiges et al. (2015)

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DOI: 10.1109/IRPS.2015.7112729

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Phil Oldiges, Kenneth P. Rodbell, Michael S. Gordon, John G. Massey, Kevin Stawiasz, Conal E. Murray, Henry H. K. Tang, K. Kim, K. Paul Muller:
SOI FinFET soft error upset susceptibility and analysis. IRPS 2015: 4

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