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"Extended RVS characterisation of STT-MRAM devices: Enabling detection of ..."

Barry J. O'Sullivan et al. (2018)

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DOI: 10.1109/IRPS.2018.8353678

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - conf/irps/OSullivanBRRKCS18
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Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, Sidharth Rao, Wonsub Kim, S. Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar:
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS 2018: 5-1

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