"Transistor aging and reliability in 14nm tri-gate technology."

Steven R. Novak et al. (2015)

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DOI: 10.1109/IRPS.2015.7112692

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-25

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Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan:
Transistor aging and reliability in 14nm tri-gate technology. IRPS 2015: 2

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