"Influence of supply voltage on the multi-cell upset soft error sensitivity ..."

Balaji Narasimham et al. (2015)

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DOI: 10.1109/IRPS.2015.7112679

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Balaji Narasimham, Jung K. Wang, Narayana Vedula, Saket Gupta, Brandon Bartz, Carl Monzel, Indranil Chatterjee, Bharat L. Bhuva, Ronald D. Schrimpf, Robert A. Reed:
Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs. IRPS 2015: 2

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