"Scaling Trends and the Effect of Process Variations on the Soft Error Rate ..."

Balaji Narasimham et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118025

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau:
Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs. IRPS 2023: 1-4

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