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"On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs."
Peter Moens et al. (2024)
- Peter Moens, F. Geenen, M. Avramenko, G. Gomez-Garcia, Kevin Matocha:
On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs. IRPS 2024: 1-7
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