"Modeling Hot-Electron Trapping in GaN-based HEMTs."

Nicola Modolo et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764414

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Nicola Modolo, Carlo De Santi, Andrea Minetto, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Modeling Hot-Electron Trapping in GaN-based HEMTs. IRPS 2022: 10

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