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"A Generalized Approach to Determine the Switching Reliability of GaN HEMTs ..."
Nicola Modolo et al. (2021)
- Nicola Modolo, Andrea Minetto, Carlo De Santi, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. IRPS 2021: 1-5
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