"Industrial approach to the chip and package reliability of SiC MOSFETs ..."

Elena Mengotti et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118084

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Elena Mengotti, Enea Bianda, David Baumann, Gerd Schlottig, Francisco Canales:
Industrial approach to the chip and package reliability of SiC MOSFETs (Invited). IRPS 2023: 1-6

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