"Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and ..."

Fabrizio Masin et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129116

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-21

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Fabrizio Masin, Matteo Meneghini, Eleonora Canato, Alessandro Barbato, Carlo De Santi, Arno Stockman, Abhishek Banerjee, Peter Moens, Enrico Zanoni, Gaudenzio Meneghesso:
Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions. IRPS 2020: 1-4

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