"Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and ..."

Rasik Rashid Malik et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117793

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Rasik Rashid Malik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mehak Ashraf Mir, Zubear Khan, Avinas N. Shaji, Madhura Bhattacharya, Anup T. Vitthal, Mayank Shrivastava:
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. IRPS 2023: 1-4

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