"Effect of Precursor Defects in Oxide Layer on Ionizing Radiation Damage of ..."

Fengkai Liu et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118017

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Fengkai Liu, Lei Wu, Kai Wang, Enhao Guan, Xingji Li:
Effect of Precursor Defects in Oxide Layer on Ionizing Radiation Damage of Bipolar Junction Transistors. IRPS 2023: 1-6

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