"Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing."

Chung-Shuo Lee et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128331

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan:
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing. IRPS 2020: 1-6

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