"Failure mode analysis of GaN-HEMT under high temperature operation."

Yasuyo Kurachi et al. (2018)

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DOI: 10.1109/IRPS.2018.8353706

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Yasuyo Kurachi, Hiroshi Yamamoto, Yukinori Nose, Satoshi Shimizu, Yasunori Tateno, Takumi Yonemura, Masato Furukawa:
Failure mode analysis of GaN-HEMT under high temperature operation. IRPS 2018: 3-1

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