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"Defect-Assisted Safe Operating Area Limits and High Current Failure in ..."
Nagothu Karmel Kranthi et al. (2018)
- Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava:
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS 2018: 3
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