"Statistical modeling and reliability prediction for transient luminance ..."

Heejin Kim et al. (2018)

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DOI: 10.1109/IRPS.2018.8353566

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type: Conference or Workshop Paper

metadata version: 2024-03-04

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Heejin Kim, Hayeon Shin, Jiyoung Park, Youngtae Choi, Jongwoo Park:
Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs. IRPS 2018: 3

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