"Reliability Assessment of 3nm GAA Logic Technology Featuring ..."

Seongkyung Kim et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117953

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Seongkyung Kim, Hyerim Park, Eunyu Choi, Young Han Kim, Dahyub Kim, Hyewon Shim, Shin-Young Chung, Paul Jung:
Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs. IRPS 2023: 1-8

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