"On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS."

J. Kim et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529354

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-30

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J. Kim, T. Daniel Loveless, J. Pew, R. Young, D. Reising, M. Nour, P. Manos, M. Chambers, Hugh J. Barnaby, Jereme Neuendank:
On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS. IRPS 2024: 1-6

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