"Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET."

Taeyoung Kim et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529466

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-31

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  - conf/irps/KimLMPNLWKNCLHBKJKPKKYLCNYKKPKHKHS24
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Taeyoung Kim, Suhwan Lim, Ilho Myeong, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Moonkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Ilyoung Yoon, Chaeho Kim, Kwanzsoo Kim, Kwanzmin Park, Bong Jin Kuh, Jinseong Heo, Wanki Kim, Daewon Ha, Jaihyuk Song:
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET. IRPS 2024: 6

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