"Short-term reliability of high performance Q-band AlN/GaN HEMTs."

Riad Kabouche et al. (2020)

Details and statistics

DOI: 10.1109/IRPS45951.2020.9129322

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-04

a service of  Schloss Dagstuhl - Leibniz Center for Informatics