"A Statistical Learning Model for Accurate Prediction of Time-Dependent ..."

Kaustubh Joshi et al. (2019)

> Home

Details and statistics

DOI: 10.1109/IRPS.2019.8720424

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/JoshiLYCBLSC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/JoshiLYCBLSC19
Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen:
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. IRPS 2019: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.