"Impact of supply voltage and particle LET on the soft error rate of logic ..."

Hui Jiang et al. (2018)

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DOI: 10.1109/IRPS.2018.8353586

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Hui Jiang, H. Zhang, R. C. Harrington, J. A. Maharrey, J. S. Kauppila, Lloyd W. Massengill, Bharat L. Bhuva:
Impact of supply voltage and particle LET on the soft error rate of logic circuits. IRPS 2018: 4

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