"Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS ..."

M. Jamil et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117992

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey:
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. IRPS 2023: 1-5

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