"Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 ..."

Mitsuhiko Igarashi et al. (2019)

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DOI: 10.1109/IRPS.2019.8720508

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani:
Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process. IRPS 2019: 1-6

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