"Permanent and Transient Effects of High-Temperature Bias Stress on Room- ..."

Daniel B. Habersat, Ronald Green, Aivars J. Lelis (2019)

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DOI: 10.1109/IRPS.2019.8720538

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Daniel B. Habersat, Ronald Green, Aivars J. Lelis:
Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs. IRPS 2019: 1-4

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