"Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs."

Amartya Ghosh et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128318

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-20

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  dblp key:
  - conf/irps/GhoshHCKSHKA20
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Amartya Ghosh, Jifa Hao, Michael Cook, Chris Kendrick, Samia A. Suliman, Gavin D. R. Hall, Tom Kopley, Osama O. Awadelkarim:
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. IRPS 2020: 1-4

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