"Reliability Limiting Defects in MOS Gate Oxides: Mechanisms and Modeling ..."

Daniel M. Fleetwood (2019)

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DOI: 10.1109/IRPS.2019.8720427

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Daniel M. Fleetwood:
Reliability Limiting Defects in MOS Gate Oxides: Mechanisms and Modeling Implications. IRPS 2019: 1-10

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