"Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk ..."

Alexandra Feeley et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405124

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type: Conference or Workshop Paper

metadata version: 2021-05-20

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Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung:
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology. IRPS 2021: 1-5

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