"Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging."

Yi-Pin Fang, Anthony S. Oates (2018)

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DOI: 10.1109/IRPS.2018.8353584

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Yi-Pin Fang, Anthony S. Oates:
Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging. IRPS 2018: 4

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