"Investigation of Retention Characteristics in a Triple-level Charge Trap ..."

Yunjie Fan et al. (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764506

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/FanWYHH22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/FanWYHH22
Yunjie Fan, Zhiqiang Wang, Shengwei Yang, Kun Han, Yi He:
Investigation of Retention Characteristics in a Triple-level Charge Trap 3D NAND Flash Memory. IRPS 2022: 31-1

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.