"Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric ..."

Devanarayanan Ettisserry et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529336

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Devanarayanan Ettisserry, Angelo Visconti, Mauro Bonanomi, Riccardo Pazzocco, Andrea Locatelli, Alessandro Sebastiani, Ashonita Chavan, Matthew Hollander, Giorgio Servalli, Alessandro Calderoni, Nirmal Ramaswamy:
Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. IRPS 2024: 1-8

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