"Insight Into HCI Reliability on I/O Nitrided Devices."

C. Doyen et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117681

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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C. Doyen, V. Yon, Xavier Garros, Luigi Basset, Tadeu Mota Frutuoso, C. Dagon, Cheikh Diouf, X. Federspiel, V. Millon, Frederic Monsieur, C. Pribat, David Roy:
Insight Into HCI Reliability on I/O Nitrided Devices. IRPS 2023: 1-5

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