"Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF ..."

Maximilian Dammann et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405227

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-27

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Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause, Andreas Graff, Michél Simon-Najasek:
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. IRPS 2021: 1-7

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