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"Analysis of 28 nm SRAM cell stability under mechanical load applied by ..."
André Clausner et al. (2018)
- André Clausner, Simon Schlipf, Gottfried Kurz, Michael Otto, Jens Paul, Kay-Uwe Giering, Jens Warmuth, André Lange, Roland Jancke, Andreas Aal, Rüdiger Rosenkranz, Martin Gall, Ehrenfried Zschech:
Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation. IRPS 2018: 5
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