"Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN ..."

Marcello Cioni, Nicolò Zagni, Alessandro Chini (2022)

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DOI: 10.1109/IRPS48227.2022.9764502

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Marcello Cioni, Nicolò Zagni, Alessandro Chini:
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications. IRPS 2022: 11

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