"Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme."

Wei-Chih Chien et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764481

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-14

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Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, Chia-Sheng Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung:
Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. IRPS 2022: 7-1

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