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"Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap ..."
Dibyendu Chatterjee et al. (2024)
- Dibyendu Chatterjee, Uma Sharma, Hiroshi Murai, Tomohiko Kudo, Raghu Singanamalla, Haitao Liu:
Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap for DRAM Periphery. IRPS 2024: 22
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