"Machine Learning On Transistor Aging Data: Test Time Reduction and ..."

Neel Chatterjee et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405188

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-01

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Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret:
Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. IRPS 2021: 1-9

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